{"id":78,"date":"2014-07-15T12:00:23","date_gmt":"2014-07-15T10:00:23","guid":{"rendered":"http:\/\/test.wielgoszewski.pl\/?p=78"},"modified":"2016-02-20T17:30:31","modified_gmt":"2016-02-20T16:30:31","slug":"rozprawa-doktorska","status":"publish","type":"post","link":"https:\/\/grzegorz.wielgoszewski.pl\/en\/rozprawa-doktorska\/","title":{"rendered":"PhD Thesis"},"content":{"rendered":"<p><\/p>\n<h3>Metrology of thermal properties of\u00a0micro-\u00a0and\u00a0nanostructures using\u00a0near-field scanning thermal microscopy<\/h3>\n<p><!--more--><br \/>\nSince the first scanning probe microscope was constructed in the 1980s, a number of various near-field methods have been developed to investigate the nanoworld in terms of its diverse properties. Among these, there is the scanning thermal microscopy (SThM), designed for simultaneous atomic-scale imaging of surface topography with temperature or thermal conductivity.<\/p>\n<p>Increasing interest in SThM has recently led to the need of comparisons between different laboratories, developing the techniques and scattered around the world. However, lack of metrology standards concerning SThM measurements has been revealed. Every research team uses its own calibration procedures, which usually cannot be compared with each other. Therefore, direct comparison of obtained results is not possible, especially when absolute temperatures are concerned. It could be even said that the development of the methods of thermal properties investigation has~restrained because of the fact that it is difficult to evaluate the claimed innovations.<\/p>\n<p>The aim of the thesis is to provide metrological description of scanning thermal microscopy realised using optimally-designed thermoresistive nanoprobes. To achieve this goal, the development of specialised measurement and control devices was required. Moreover, the author was involved in the process of designing a novel thermoresistive nanoprobe, which he also tested and applied to SThM measurements.<\/p>\n<p>Within the research done on the thesis, the following results have been achieved:<\/p>\n<ul>\n<li>successful application of <strong>novel IET\/WRUT thermoresistive nanoprobes<\/strong> to SThM measurements (<a title=\"Novel SThM nanoprobe for thermal properties investigation of micro- and nanoelectronic devices\" href=\"http:\/\/dx.doi.org\/10.1016\/j.mee.2009.11.178\" target=\"_blank\">Janus <em>et al.<\/em>, 2010<\/a>; <a title=\"Microfabricated resistive high-sensitivity nanoprobe for scanning thermal microscopy\" href=\"http:\/\/dx.doi.org\/10.1116\/1.3502614\" target=\"_blank\">Wielgoszewski <em>et al.<\/em>, 2010<\/a>);<\/li>\n<li>development of an SThM system at the Division of Metrology of Micro- and Nanostructures (Faculty of Microsystem Electronics and Photonics, Wroc\u0142aw University of Technology), including a specialised SThM module with a <strong>novel modified Wheatstone bridge<\/strong> (<a title=\"A high-resolution measurement system for novel scanning thermal microscopy resistive nanoprobes\" href=\"http:\/\/dx.doi.org\/10.1088\/0957-0233\/22\/9\/094023\" target=\"_blank\">Wielgoszewski <em>et al.<\/em>, 2011<\/a>);<\/li>\n<li><strong>SThM nanoprobe calibration<\/strong> according to standard-based procedure, developed by the author (<a title=\"Standard-based direct calibration method for scanning thermal microscopy nanoprobes\" href=\"http:\/\/dx.doi.org\/10.1016\/j.sna.2014.03.035\" target=\"_blank\">Wielgoszewski <em>et al.<\/em>, 2014<\/a>);<\/li>\n<li>development and application of the <strong>tip thermal mapping (TThM)<\/strong> procedure (<a title=\"Thermal mapping of a scanning thermal microscopy tip\" href=\"http:\/\/dx.doi.org\/10.1016\/j.ultramic.2013.06.020\" target=\"_blank\">J\u00f3\u017awiak <em>et al.<\/em>, 2013<\/a>).<\/li>\n<\/ul>\n<p>The research, results of which are described in the thesis, has been conducted in close collaboration with teams from Institute of Electron Technology in\u00a0Warsaw, Poland, AMD\u00a0Saxony\u00a0LLC &amp;\u00a0Co.\u00a0KG in\u00a0Dresden, Germany, Fraunhofer Institute for Nondestructive Testing, Dresden branch, Germany, and College for Nanoscale Science and Engineering, Albany, NY, USA. The experience gained during the experiments has supported the EU project <a title=\"STREP NANOHEAT\" href=\"http:\/\/nanoheat-project.eu\" target=\"_blank\">STREP NANOHEAT<\/a>, realised within the 7th Framework Programme.<\/p>\n<p><a href=\"http:\/\/grzegorz.wielgoszewski.pl\/rozprawa-doktorska\/gjw-sthm-metrology-compressed\/\" rel=\"attachment wp-att-387\">Metrologia w\u0142a\u015bciwo\u015bci termicznych mikro- i nanostruktur prowadzona metodami skaningowej mikroskopii termicznej bliskiego pola \u2013 full text of the thesis (in Polish)<\/a><\/p>\n<blockquote><p>I submitted the thesis in Polish. However, most of its research-related content is similar to above-mentioned papers. Moreover, I was invited by Peter\u00a0W.\u00a0Hawkes to prepare a chapter on SThM for \u201cAdvances in Electron Physics and Imaging,\u201d available <a href=\"http:\/\/dx.doi.org\/10.1016\/bs.aiep.2015.03.011\" title=\"Scanning Thermal Microscopy (SThM): How to Map Temperature and Thermal Properties at the Nanoscale\" target=\"_blank\">here<\/a>. It is largely based on the introductory part of my thesis. Should you be interested in any of these papers, please feel free to contact me by e-mail: <span style=\"text-align: left; direction: rtl; unicode-bidi: bidi-override;\"><a>lp.ikswezsogleiw@etisbew<\/a><\/span> or via <a href=\"https:\/\/www.researchgate.net\/profile\/Grzegorz_Wielgoszewski\" title=\"Grzegorz Wielgoszewski on ResearchGate\" target=\"_blank\">my ResearchGate profile<\/a>.<\/p><\/blockquote>\n<p><\/p>","protected":false},"excerpt":{"rendered":"<p>Sorry, this entry is only available in polski.<\/p>\n","protected":false},"author":1,"featured_media":65,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"ngg_post_thumbnail":0,"footnotes":""},"categories":[3],"tags":[],"class_list":["post-78","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-doswiadczenie"],"_links":{"self":[{"href":"https:\/\/grzegorz.wielgoszewski.pl\/en\/wp-json\/wp\/v2\/posts\/78"}],"collection":[{"href":"https:\/\/grzegorz.wielgoszewski.pl\/en\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/grzegorz.wielgoszewski.pl\/en\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/grzegorz.wielgoszewski.pl\/en\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/grzegorz.wielgoszewski.pl\/en\/wp-json\/wp\/v2\/comments?post=78"}],"version-history":[{"count":10,"href":"https:\/\/grzegorz.wielgoszewski.pl\/en\/wp-json\/wp\/v2\/posts\/78\/revisions"}],"predecessor-version":[{"id":396,"href":"https:\/\/grzegorz.wielgoszewski.pl\/en\/wp-json\/wp\/v2\/posts\/78\/revisions\/396"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/grzegorz.wielgoszewski.pl\/en\/wp-json\/wp\/v2\/media\/65"}],"wp:attachment":[{"href":"https:\/\/grzegorz.wielgoszewski.pl\/en\/wp-json\/wp\/v2\/media?parent=78"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/grzegorz.wielgoszewski.pl\/en\/wp-json\/wp\/v2\/categories?post=78"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/grzegorz.wielgoszewski.pl\/en\/wp-json\/wp\/v2\/tags?post=78"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}