{"id":148,"date":"2021-01-01T08:29:58","date_gmt":"2021-01-01T07:29:58","guid":{"rendered":"http:\/\/grzegorz.wielgoszewski.pl\/?p=148"},"modified":"2021-01-31T00:48:00","modified_gmt":"2021-01-30T23:48:00","slug":"publikacje","status":"publish","type":"post","link":"https:\/\/grzegorz.wielgoszewski.pl\/en\/publikacje\/","title":{"rendered":"Publications"},"content":{"rendered":"

pp. 3149-3159<\/span>, American Chemical Society<\/span>, doi:10.1021\/acsptsci.5c00312<\/span><\/a><\/span>
<\/p>\n

2024<\/h2>

Alexander Sturm, Grzegorz J\u00f3\u017awiak, Marta Pla Verge, Laura Munch, Gino Cathomen, Anthony Vocat, Amanda Luraschi-Eggemann, Clara Orlando, Katja Fromm, Eric Delarze, Micha\u0142 \u015awi\u0105tkowski, Grzegorz Wielgoszewski, Roxana M. Totu, Mar\u00eda Garc\u00eda-Castillo, Alexandre Delfino, Florian Tagini, Sandor Kasas, Cornelia Lass-Fl\u00f6rl, Ronald Gstir, Rafael Cant\u00f3n, Gilbert Greub, Danuta Cichocka<\/span> (2024)<\/span> Accurate and rapid antibiotic susceptibility testing using a machine learning-assisted nanomotion technology platform<\/span>, Nature Communications<\/span> 15<\/span>(1)<\/span>, Nature Research<\/span>, doi:10.1038\/s41467-024-46213-y<\/span><\/a><\/span>
<\/p>\n

2023<\/h2>

Anthony Vocat, Alexander Sturm, Grzegorz J\u00f3\u017awiak, Gino Cathomen, Micha\u0142 \u015awi\u0105tkowski, Roxana Buga, Grzegorz Wielgoszewski, Danuta Cichocka, Gilbert Greub, Onya Opota<\/span> (2023)<\/span> Nanomotion technology in combination with machine learning: a new approach for a rapid antibiotic susceptibility test for Mycobacterium tuberculosis<\/span>, Microbes and Infection<\/span> 25<\/span>(7)<\/span>, pp. 105151<\/span>, url<\/span><\/a><\/span>, doi:10.1016\/j.micinf.2023.105151<\/span><\/a><\/span>
<\/p>\n

2022<\/h2>

Finn Hunkeler, Micha\u0142 \u015awi\u0105tkowski, Grzegorz Wielgoszewski<\/span> (2022)<\/span> Tweezer<\/span>, World Intellectual Property Organization<\/span>
<\/p>\n

2021<\/h2>

Eric Delarze, Amanda Luraschi, Micha\u0142 \u015awi\u0105tkowski, Grzegorz Wielgoszewski, Michael Siegert<\/span> (2021)<\/span> Attachment of biological and non-biological objects, e.g. bacterial cells, to surfaces, e.g cantilevers<\/span>, World Intellectual Property Organization<\/span>, url<\/span><\/a><\/span>
<\/p>\n

2018<\/h2>

Micha\u0142 \u015awi\u0105tkowski, Arkadiusz Wojtu\u015b, Grzegorz Wielgoszewski, Maciej Rudek, Tomasz Piasecki, Grzegorz J\u00f3\u017awiak, Teodor Gotszalk<\/span> (2018)<\/span> A low-noise measurement system for scanning thermal microscopy resistive nanoprobes based on a transformer ratio-arm bridge<\/span>, Measurement Science and Technology<\/span> 29<\/span>(4)<\/span>, pp. 045901<\/span>, url<\/span><\/a><\/span>, doi:10.1088\/1361-6501\/aa9d10<\/span><\/a><\/span>
<\/p>\n

2016<\/h2>

Grzegorz Wielgoszewski, Magdalena Mocza\u0142a, Karolina Or\u0142owska, Piotr S\u00f3wka, Wenzhe Cao, Sigurd Wagner, Teodor Gotszalk<\/span> (2016)<\/span> A symmetrical stretching stage for electrical atomic force microscopy<\/span>, Measurement<\/span> 87<\/span>, pp. 185-188<\/span>, url<\/span><\/a><\/span>, doi:10.1016\/j.measurement.2016.03.031<\/span><\/a><\/span>
<\/p>\n

2015<\/h2>

Grzegorz Wielgoszewski, Piotr Pa\u0142etko, Daniel Tomaszewski, Micha\u0142 Zaborowski, Grzegorz J\u00f3\u017awiak, Daniel Kopiec, Teodor Gotszalk, Piotr Grabiec<\/span> (2015)<\/span> Carrier density distribution in silicon nanowires investigated by scanning thermal microscopy and Kelvin probe force microscopy<\/span>, Micron<\/span> 79<\/span>, pp. 93-100<\/span>, url<\/span><\/a><\/span>, doi:10.1016\/j.micron.2015.08.004<\/span><\/a><\/span>
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Grzegorz Wielgoszewski, Teodor Gotszalk<\/span> (2015)<\/span> Scanning Thermal Microscopy (SThM): How to Map Temperature and Thermal Properties at the Nanoscale<\/span>, Advances in Imaging and Electron Physics, Vol. 190<\/span>, Peter W. Hawkes (ed.)<\/span>, pp. 177-221<\/span>, Burlington: Academic Press<\/span>, url<\/span><\/a><\/span>, doi:10.1016\/bs.aiep.2015.03.011<\/span><\/a><\/span>
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Krzysztof Gajewski, Daniel Kopiec, Magdalena Mocza\u0142a, Adam Piotrowicz, Micha\u0142 Zielony, Grzegorz Wielgoszewski, Teodor Gotszalk, W\u0142odek Strupi\u0144ski<\/span> (2015)<\/span> Scanning probe microscopy investigations of the electrical properties of chemical vapor deposited graphene grown on a 6H-SiC substrate<\/span>, Micron<\/span> 68<\/span>, pp. 17-22<\/span>, url<\/span><\/a><\/span>, doi:10.1016\/j.micron.2014.08.005<\/span><\/a><\/span>
<\/p>\n

2014<\/h2>

Grzegorz Wielgoszewski, Grzegorz J\u00f3\u017awiak, Micha\u0142 Babij, Tomasz Baraniecki, Robert Geer, Teodor Gotszalk<\/span> (2014)<\/span> Investigation of thermal effects in through-silicon vias using scanning thermal microscopy<\/span>, Micron<\/span> 66<\/span>, pp. 63-68<\/span>, url<\/span><\/a><\/span>, doi:10.1016\/j.micron.2014.05.008<\/span><\/a><\/span>
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Jerzy Bodzenta, Justyna Juszczyk, Anna Ka\u017amierczak-Ba\u0142ata, Grzegorz Wielgoszewski<\/span> (2014)<\/span> Photothermal Measurement by the Use of Scanning Thermal Microscopy<\/span>, International Journal of Thermophysics<\/span>, url<\/span><\/a><\/span>, doi:10.1007\/s10765-014-1613-5<\/span><\/a><\/span>
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Christian Kraeh, Alexandru Popescu, Markus Schieber, Harry Hedler, Tomasz Bieniek, Grzegorz Wielgoszewski, Magdalena Mocza\u0142a, Jonathan Finley<\/span> (2014)<\/span> Fabrication of high aspect ratio microtube arrays for 2D photonic crystals<\/span>, Materials Research Express<\/span> 1<\/span>(2)<\/span>, pp. 026201<\/span>, url<\/span><\/a><\/span>, doi:10.1088\/2053-1591\/1\/2\/026201<\/span><\/a><\/span>
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Grzegorz Wielgoszewski, Micha\u0142 Babij, Roman F. Szeloch, Teodor Gotszalk<\/span> (2014)<\/span> Standard-based direct calibration method for scanning thermal microscopy nanoprobes<\/span>, Sensors and Actuators A: Physical<\/span> 214<\/span>, pp. 1-6<\/span>, url<\/span><\/a><\/span>, doi:10.1016\/j.sna.2014.03.035<\/span><\/a><\/span>
<\/p>\n

2013<\/h2>

Krzysztof Gajewski, Daniel Kopiec, Maciej Rudek, Pawe\u0142 Zawierucha, Micha\u0142 Zielony, Magdalena Mocza\u0142a, Grzegorz Wielgoszewski, Teodor Gotszalk, W\u0142odzimierz Strupi\u0144ski<\/span> (2013)<\/span> Skaningowy mikroskop tunelowy do bada\u0144 nanostruktur grafenowych<\/span>, Elektronika<\/span> 54<\/span>(6)<\/span>, pp. 14-18<\/span>, url<\/span><\/a><\/span>
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Grzegorz Wielgoszewski, Grzegorz J\u00f3\u017awiak, Micha\u0142 Babij, Teodor Gotszalk, Pawe\u0142 Janus, Piotr Grabiec, Robert E. Geer<\/span> (2013)<\/span> Calibration Issues in Scanning Thermal Microscopy Investigations of Thermal Properties of Micro- and Nanostructures<\/span>, Microtherm 2013<\/span>, Jacek Podg\u00f3rski (ed.)<\/span>, pp. 117-121<\/span>, \u0141\u00f3d\u017a: Politechnika \u0141\u00f3dzka<\/span>
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Tomasz Bieniek, Grzegorz Janczyk, Pawe\u0142 Janus, Piotr Grabiec, Marek Nieprzecki, Grzegorz Wielgoszewski, Magdalena Mocza\u0142a, Teodor Gotszalk, Elizabeth Buitrago, Montserrat F. Badia, Adrian M. Ionescu<\/span> (2013)<\/span> Silicon nanowires reliability and robustness investigation using AFM-based techniques<\/span>, Proceedings of the SPIE 8902: 11th Electron Technology Conference 2013<\/span>, Pawe\u0142 Szczepa\u0144ski, Ryszard Kisiel, Ryszard S. Romaniuk (ed.)<\/span>, pp. 89022L<\/span>, Ryn: SPIE<\/span>, url<\/span><\/a><\/span>, doi:10.1117\/12.2031229<\/span><\/a><\/span>
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Grzegorz J\u00f3\u017awiak, Grzegorz Wielgoszewski, Teodor Gotszalk, Leszek K\u0119pi\u0144ski<\/span> (2013)<\/span> Thermal mapping of a scanning thermal microscopy tip<\/span>, Ultramicroscopy<\/span> 133<\/span>, pp. 80-87<\/span>, url<\/span><\/a><\/span>, doi:10.1016\/j.ultramic.2013.06.020<\/span><\/a><\/span>
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2011<\/h2>

Krzysztof Gajewski, Teodor Gotszalk, Grzegorz Wielgoszewski<\/span> (2011)<\/span> Wykorzystanie mikroskopu si\u0142 atomowych w trybie sta\u0142ego pr\u0105du do badania materia\u0142\u00f3w przewodz\u0105cych i tlenkowych<\/span>, Elektronika<\/span> 52<\/span>(10)<\/span>, pp. 104-106<\/span>
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Micha\u0142 \u015awi\u0105tkowski, Grzegorz Wielgoszewski, Jaros\u0142aw Olszewski, Teodor Gotszalk<\/span> (2011)<\/span> Uk\u0142ad samowzbudny na bazie wagi kwarcowej do kalibracji mikroskopu AFM<\/span>, Wiadomo\u015bci Elektrotechniczne<\/span> 79<\/span>(10)<\/span>, pp. 26-28<\/span>
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Grzegorz Wielgoszewski, Przemys\u0142aw Sulecki, Pawe\u0142 Janus, Piotr Grabiec, Ehrenfried Zschech, Teodor Gotszalk<\/span> (2011)<\/span> A high-resolution measurement system for novel scanning thermal microscopy resistive nanoprobes<\/span>, Measurement Science and Technology<\/span> 22<\/span>(9)<\/span>, pp. 094023<\/span>, url<\/span><\/a><\/span>, doi:10.1088\/0957-0233\/22\/9\/094023<\/span><\/a><\/span>
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Grzegorz Wielgoszewski, Przemys\u0142aw Sulecki, Teodor Gotszalk, Pawe\u0142 Janus, Piotr Grabiec, Michael Hecker, Yvonne Ritz, Ehrenfried Zschech<\/span> (2011)<\/span> Scanning thermal microscopy: A nanoprobe technique for studying the thermal properties of nanocomponents<\/span>, Physica Status Solidi B<\/span> 248<\/span>(2)<\/span>, pp. 370-374<\/span>, url<\/span><\/a><\/span>, doi:10.1002\/pssb.201046614<\/span><\/a><\/span>
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2010<\/h2>

G. Ma\u0142ozi\u0229\u0107, T. Gotszalk, K. Nieradka, G. Wielgoszewski, P. Sulecki, J. Radojewski, P. Grabiec, P. Janus<\/span> (2010)<\/span> Multibeam setup for observation of the cantilever deflection in the micromechanical sensors matrix<\/span>, Przeglad Elektrotechniczny<\/span> 86<\/span>(10)<\/span>
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Grzegorz Ma\u0142ozi\u0119\u0107, Teodor Gotszalk, Konrad Nieradka, Grzegorz Wielgoszewski, Przemys\u0142aw Sulecki, Jacek Radojewski, Piotr Grabiec, Pawe\u0142 Janus<\/span> (2010)<\/span> Wielowi\u0105zkowy uk\u0142ad do obserwacji ugi\u0119cia d\u017awigni macierzy czujnik\u00f3w mikromechanicznych<\/span>, Przegl\u0105d Elektrotechniczny<\/span> 86<\/span>(10)<\/span>, pp. 83-85<\/span>
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Krzysztof Gajewski, Grzegorz Wielgoszewski<\/span> (2010)<\/span> Methods of investigation of the properties of the optoelectronic devices with use of atomic force microscopy<\/span>, 2010 International Students and Young Scientists Workshop \"Photonics and Microsystems\"<\/span>, pp. 18-20<\/span>, IEEE<\/span>, url<\/span><\/a><\/span>, doi:10.1109\/STYSW.2010.5714160<\/span><\/a><\/span>
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Grzegorz Wielgoszewski, Przemys\u0142aw Sulecki, Teodor Gotszalk, Pawe\u0142 Janus, Dariusz Szmigiel, Piotr Grabiec, Ehrenfried Zschech<\/span> (2010)<\/span> Microfabricated resistive high-sensitivity nanoprobe for scanning thermal microscopy<\/span>, Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures<\/span> 28<\/span>(6)<\/span>, pp. C6N7-C6N11<\/span>, url<\/span><\/a><\/span>, doi:10.1116\/1.3502614<\/span><\/a><\/span>
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Pawe\u0142 Janus, Dariusz Szmigiel, M. Weisheit, Grzegorz Wielgoszewski, Yvonne Ritz, Piotr Grabiec, Michael Hecker, Teodor Gotszalk, Przemys\u0142aw Sulecki, Ehrenfried Zschech<\/span> (2010)<\/span> Novel SThM nanoprobe for thermal properties investigation of micro- and nanoelectronic devices<\/span>, Microelectronic Engineering<\/span> 87<\/span>(5-8)<\/span>, pp. 1370-1374<\/span>, url<\/span><\/a><\/span>, doi:10.1016\/j.mee.2009.11.178<\/span><\/a><\/span>
<\/p>\n

2009<\/h2>

Grzegorz Jan Wielgoszewski<\/span> (2009)<\/span> Pomiary cienkich warstw dielektryk\u00f3w podbramkowych za pomoc\u0105 sond z przewodz\u0105cymi ostrzami<\/span>, Innowacyjne rozwi\u0105zania w obszarze automatyki, robotyki i pomiar\u00f3w<\/span>, Janusz Kacprzyk (ed.)<\/span>, pp. 7-17<\/span>, Warszawa: Przemys\u0142owy Instytut Automatyki i Pomiar\u00f3w<\/span>
<\/p>\n

2008<\/h2>

Grzegorz Wielgoszewski, Teodor Gotszalk, Miros\u0142aw Woszczyna, Pawe\u0142 Zawierucha, Ehrenfried Zschech<\/span> (2008)<\/span> Conductive atomic force microscope for investigation of thin-film gate insulators<\/span>, Bulletin of the Polish Academy of Sciences: Technical Sciences<\/span> 56<\/span>(1)<\/span>, pp. 39-44<\/span>, pdf<\/span><\/a><\/span>
<\/p>\n

2007<\/h2>

Grzegorz Wielgoszewski, Miros\u0142aw Woszczyna, Klaudiusz Wo\u017aniak, Pawe\u0142 Zawierucha, Rados\u0142aw Zwierz<\/span> (2007)<\/span> Analogowy regulator PID z cyfrowymi potencjometrami dla system\u00f3w mikroskopii bliskich oddzia\u0142ywa\u0144<\/span>, V Konferencja Naukowa Student\u00f3w<\/span>, Wroc\u0142aw: Politechnika Wroc\u0142awska<\/span>
<\/p>\n

2006<\/h2>

Grzegorz Jan Wielgoszewski, Piotr Mulak, Klaudiusz Wo\u017aniak, Wiktor Herwich, Micha\u0142 Zielony<\/span> (2006)<\/span> Uniwersalny cyfrowy regulator PID do sterowania temperatur\u0105 w uk\u0142adach mikrosystemowych i optoelektronicznych<\/span>, IV Konferencja Naukowa Student\u00f3w<\/span>, Wroc\u0142aw: Politechnika Wroc\u0142awska<\/span>
<\/p>\n
\n<\/p>\n

(Je\u015bli lista publikacji si\u0119 nie wy\u015bwietla, zapraszam na m\u00f3j profil w serwisie ResearchGate<\/a>).(The list was prepared by WP Mendeley Plugin<\/a> by Michael Koch.)<\/p>\n

2025<\/h2>

Katja Fromm, Jan Winnicki, Grzegorz J\u00f3\u017awiak, Gino Cathomen, Christine Wagner, Marta Pla Verge, Eric Delarze, Micha\u0142 \u015awi\u0105tkowski, Grzegorz Wielgoszewski, Maria Ines Villalba, Laura Munch, Sandor Kasas, Danuta Cichocka, Alexander Sturm<\/span> (2025)<\/span> Nanomotion-Based Drug Sensitivity Prediction in Ovarian and Colon Cancer Cell Lines Using Machine Learning<\/span>, ACS Pharmacology and Translational Science<\/span> 8<\/span>(9)<\/span>, pp. 3149-3159<\/span>, American Chemical Society<\/span>, doi:10.1021\/acsptsci.5c00312<\/span><\/a><\/span>
<\/p>\n

2024<\/h2>

Alexander Sturm, Grzegorz J\u00f3\u017awiak, Marta Pla Verge, Laura Munch, Gino Cathomen, Anthony Vocat, Amanda Luraschi-Eggemann, Clara Orlando, Katja Fromm, Eric Delarze, Micha\u0142 \u015awi\u0105tkowski, Grzegorz Wielgoszewski, Roxana M. Totu, Mar\u00eda Garc\u00eda-Castillo, Alexandre Delfino, Florian Tagini, Sandor Kasas, Cornelia Lass-Fl\u00f6rl, Ronald Gstir, Rafael Cant\u00f3n, Gilbert Greub, Danuta Cichocka<\/span> (2024)<\/span> Accurate and rapid antibiotic susceptibility testing using a machine learning-assisted nanomotion technology platform<\/span>, Nature Communications<\/span> 15<\/span>(1)<\/span>, Nature Research<\/span>, doi:10.1038\/s41467-024-46213-y<\/span><\/a><\/span>
<\/p>\n

2023<\/h2>

Anthony Vocat, Alexander Sturm, Grzegorz J\u00f3\u017awiak, Gino Cathomen, Micha\u0142 \u015awi\u0105tkowski, Roxana Buga, Grzegorz Wielgoszewski, Danuta Cichocka, Gilbert Greub, Onya Opota<\/span> (2023)<\/span> Nanomotion technology in combination with machine learning: a new approach for a rapid antibiotic susceptibility test for Mycobacterium tuberculosis<\/span>, Microbes and Infection<\/span> 25<\/span>(7)<\/span>, pp. 105151<\/span>, url<\/span><\/a><\/span>, doi:10.1016\/j.micinf.2023.105151<\/span><\/a><\/span>
<\/p>\n

2022<\/h2>

Finn Hunkeler, Micha\u0142 \u015awi\u0105tkowski, Grzegorz Wielgoszewski<\/span> (2022)<\/span> Tweezer<\/span>, World Intellectual Property Organization<\/span>
<\/p>\n

2021<\/h2>

Eric Delarze, Amanda Luraschi, Micha\u0142 \u015awi\u0105tkowski, Grzegorz Wielgoszewski, Michael Siegert<\/span> (2021)<\/span> Attachment of biological and non-biological objects, e.g. bacterial cells, to surfaces, e.g cantilevers<\/span>, World Intellectual Property Organization<\/span>, url<\/span><\/a><\/span>
<\/p>\n

2018<\/h2>

Micha\u0142 \u015awi\u0105tkowski, Arkadiusz Wojtu\u015b, Grzegorz Wielgoszewski, Maciej Rudek, Tomasz Piasecki, Grzegorz J\u00f3\u017awiak, Teodor Gotszalk<\/span> (2018)<\/span> A low-noise measurement system for scanning thermal microscopy resistive nanoprobes based on a transformer ratio-arm bridge<\/span>, Measurement Science and Technology<\/span> 29<\/span>(4)<\/span>, pp. 045901<\/span>, url<\/span><\/a><\/span>, doi:10.1088\/1361-6501\/aa9d10<\/span><\/a><\/span>
<\/p>\n

2016<\/h2>

Grzegorz Wielgoszewski, Magdalena Mocza\u0142a, Karolina Or\u0142owska, Piotr S\u00f3wka, Wenzhe Cao, Sigurd Wagner, Teodor Gotszalk<\/span> (2016)<\/span> A symmetrical stretching stage for electrical atomic force microscopy<\/span>, Measurement<\/span> 87<\/span>, pp. 185-188<\/span>, url<\/span><\/a><\/span>, doi:10.1016\/j.measurement.2016.03.031<\/span><\/a><\/span>
<\/p>\n

2015<\/h2>

Grzegorz Wielgoszewski, Piotr Pa\u0142etko, Daniel Tomaszewski, Micha\u0142 Zaborowski, Grzegorz J\u00f3\u017awiak, Daniel Kopiec, Teodor Gotszalk, Piotr Grabiec<\/span> (2015)<\/span> Carrier density distribution in silicon nanowires investigated by scanning thermal microscopy and Kelvin probe force microscopy<\/span>, Micron<\/span> 79<\/span>, pp. 93-100<\/span>, url<\/span><\/a><\/span>, doi:10.1016\/j.micron.2015.08.004<\/span><\/a><\/span>
<\/p>\n

Grzegorz Wielgoszewski, Teodor Gotszalk<\/span> (2015)<\/span> Scanning Thermal Microscopy (SThM): How to Map Temperature and Thermal Properties at the Nanoscale<\/span>, Advances in Imaging and Electron Physics, Vol. 190<\/span>, Peter W. Hawkes (ed.)<\/span>, pp. 177-221<\/span>, Burlington: Academic Press<\/span>, url<\/span><\/a><\/span>, doi:10.1016\/bs.aiep.2015.03.011<\/span><\/a><\/span>
<\/p>\n

Krzysztof Gajewski, Daniel Kopiec, Magdalena Mocza\u0142a, Adam Piotrowicz, Micha\u0142 Zielony, Grzegorz Wielgoszewski, Teodor Gotszalk, W\u0142odek Strupi\u0144ski<\/span> (2015)<\/span> Scanning probe microscopy investigations of the electrical properties of chemical vapor deposited graphene grown on a 6H-SiC substrate<\/span>, Micron<\/span> 68<\/span>, pp. 17-22<\/span>, url<\/span><\/a><\/span>, doi:10.1016\/j.micron.2014.08.005<\/span><\/a><\/span>
<\/p>\n

2014<\/h2>

Grzegorz Wielgoszewski, Grzegorz J\u00f3\u017awiak, Micha\u0142 Babij, Tomasz Baraniecki, Robert Geer, Teodor Gotszalk<\/span> (2014)<\/span> Investigation of thermal effects in through-silicon vias using scanning thermal microscopy<\/span>, Micron<\/span> 66<\/span>, pp. 63-68<\/span>, url<\/span><\/a><\/span>, doi:10.1016\/j.micron.2014.05.008<\/span><\/a><\/span>
<\/p>\n

Jerzy Bodzenta, Justyna Juszczyk, Anna Ka\u017amierczak-Ba\u0142ata, Grzegorz Wielgoszewski<\/span> (2014)<\/span> Photothermal Measurement by the Use of Scanning Thermal Microscopy<\/span>, International Journal of Thermophysics<\/span>, url<\/span><\/a><\/span>, doi:10.1007\/s10765-014-1613-5<\/span><\/a><\/span>
<\/p>\n

Christian Kraeh, Alexandru Popescu, Markus Schieber, Harry Hedler, Tomasz Bieniek, Grzegorz Wielgoszewski, Magdalena Mocza\u0142a, Jonathan Finley<\/span> (2014)<\/span> Fabrication of high aspect ratio microtube arrays for 2D photonic crystals<\/span>, Materials Research Express<\/span> 1<\/span>(2)<\/span>, pp. 026201<\/span>, url<\/span><\/a><\/span>, doi:10.1088\/2053-1591\/1\/2\/026201<\/span><\/a><\/span>
<\/p>\n

Grzegorz Wielgoszewski, Micha\u0142 Babij, Roman F. Szeloch, Teodor Gotszalk<\/span> (2014)<\/span> Standard-based direct calibration method for scanning thermal microscopy nanoprobes<\/span>, Sensors and Actuators A: Physical<\/span> 214<\/span>, pp. 1-6<\/span>, url<\/span><\/a><\/span>, doi:10.1016\/j.sna.2014.03.035<\/span><\/a><\/span>
<\/p>\n

2013<\/h2>

Krzysztof Gajewski, Daniel Kopiec, Maciej Rudek, Pawe\u0142 Zawierucha, Micha\u0142 Zielony, Magdalena Mocza\u0142a, Grzegorz Wielgoszewski, Teodor Gotszalk, W\u0142odzimierz Strupi\u0144ski<\/span> (2013)<\/span> Skaningowy mikroskop tunelowy do bada\u0144 nanostruktur grafenowych<\/span>, Elektronika<\/span> 54<\/span>(6)<\/span>, pp. 14-18<\/span>, url<\/span><\/a><\/span>
<\/p>\n

Grzegorz Wielgoszewski, Grzegorz J\u00f3\u017awiak, Micha\u0142 Babij, Teodor Gotszalk, Pawe\u0142 Janus, Piotr Grabiec, Robert E. Geer<\/span> (2013)<\/span> Calibration Issues in Scanning Thermal Microscopy Investigations of Thermal Properties of Micro- and Nanostructures<\/span>, Microtherm 2013<\/span>, Jacek Podg\u00f3rski (ed.)<\/span>, pp. 117-121<\/span>, \u0141\u00f3d\u017a: Politechnika \u0141\u00f3dzka<\/span>
<\/p>\n

Tomasz Bieniek, Grzegorz Janczyk, Pawe\u0142 Janus, Piotr Grabiec, Marek Nieprzecki, Grzegorz Wielgoszewski, Magdalena Mocza\u0142a, Teodor Gotszalk, Elizabeth Buitrago, Montserrat F. Badia, Adrian M. Ionescu<\/span> (2013)<\/span> Silicon nanowires reliability and robustness investigation using AFM-based techniques<\/span>, Proceedings of the SPIE 8902: 11th Electron Technology Conference 2013<\/span>, Pawe\u0142 Szczepa\u0144ski, Ryszard Kisiel, Ryszard S. Romaniuk (ed.)<\/span>, pp. 89022L<\/span>, Ryn: SPIE<\/span>, url<\/span><\/a><\/span>, doi:10.1117\/12.2031229<\/span><\/a><\/span>
<\/p>\n

Grzegorz J\u00f3\u017awiak, Grzegorz Wielgoszewski, Teodor Gotszalk, Leszek K\u0119pi\u0144ski<\/span> (2013)<\/span> Thermal mapping of a scanning thermal microscopy tip<\/span>, Ultramicroscopy<\/span> 133<\/span>, pp. 80-87<\/span>, url<\/span><\/a><\/span>, doi:10.1016\/j.ultramic.2013.06.020<\/span><\/a><\/span>
<\/p>\n

2011<\/h2>

Krzysztof Gajewski, Teodor Gotszalk, Grzegorz Wielgoszewski<\/span> (2011)<\/span> Wykorzystanie mikroskopu si\u0142 atomowych w trybie sta\u0142ego pr\u0105du do badania materia\u0142\u00f3w przewodz\u0105cych i tlenkowych<\/span>, Elektronika<\/span> 52<\/span>(10)<\/span>, pp. 104-106<\/span>
<\/p>\n

Micha\u0142 \u015awi\u0105tkowski, Grzegorz Wielgoszewski, Jaros\u0142aw Olszewski, Teodor Gotszalk<\/span> (2011)<\/span> Uk\u0142ad samowzbudny na bazie wagi kwarcowej do kalibracji mikroskopu AFM<\/span>, Wiadomo\u015bci Elektrotechniczne<\/span> 79<\/span>(10)<\/span>, pp. 26-28<\/span>
<\/p>\n

Grzegorz Wielgoszewski, Przemys\u0142aw Sulecki, Pawe\u0142 Janus, Piotr Grabiec, Ehrenfried Zschech, Teodor Gotszalk<\/span> (2011)<\/span> A high-resolution measurement system for novel scanning thermal microscopy resistive nanoprobes<\/span>, Measurement Science and Technology<\/span> 22<\/span>(9)<\/span>, pp. 094023<\/span>, url<\/span><\/a><\/span>, doi:10.1088\/0957-0233\/22\/9\/094023<\/span><\/a><\/span>
<\/p>\n

Grzegorz Wielgoszewski, Przemys\u0142aw Sulecki, Teodor Gotszalk, Pawe\u0142 Janus, Piotr Grabiec, Michael Hecker, Yvonne Ritz, Ehrenfried Zschech<\/span> (2011)<\/span> Scanning thermal microscopy: A nanoprobe technique for studying the thermal properties of nanocomponents<\/span>, Physica Status Solidi B<\/span> 248<\/span>(2)<\/span>, pp. 370-374<\/span>, url<\/span><\/a><\/span>, doi:10.1002\/pssb.201046614<\/span><\/a><\/span>
<\/p>\n

2010<\/h2>

G. Ma\u0142ozi\u0229\u0107, T. Gotszalk, K. Nieradka, G. Wielgoszewski, P. Sulecki, J. Radojewski, P. Grabiec, P. Janus<\/span> (2010)<\/span> Multibeam setup for observation of the cantilever deflection in the micromechanical sensors matrix<\/span>, Przeglad Elektrotechniczny<\/span> 86<\/span>(10)<\/span>
<\/p>\n

Grzegorz Ma\u0142ozi\u0119\u0107, Teodor Gotszalk, Konrad Nieradka, Grzegorz Wielgoszewski, Przemys\u0142aw Sulecki, Jacek Radojewski, Piotr Grabiec, Pawe\u0142 Janus<\/span> (2010)<\/span> Wielowi\u0105zkowy uk\u0142ad do obserwacji ugi\u0119cia d\u017awigni macierzy czujnik\u00f3w mikromechanicznych<\/span>, Przegl\u0105d Elektrotechniczny<\/span> 86<\/span>(10)<\/span>, pp. 83-85<\/span>
<\/p>\n

Krzysztof Gajewski, Grzegorz Wielgoszewski<\/span> (2010)<\/span> Methods of investigation of the properties of the optoelectronic devices with use of atomic force microscopy<\/span>, 2010 International Students and Young Scientists Workshop \"Photonics and Microsystems\"<\/span>, pp. 18-20<\/span>, IEEE<\/span>, url<\/span><\/a><\/span>, doi:10.1109\/STYSW.2010.5714160<\/span><\/a><\/span>
<\/p>\n

Grzegorz Wielgoszewski, Przemys\u0142aw Sulecki, Teodor Gotszalk, Pawe\u0142 Janus, Dariusz Szmigiel, Piotr Grabiec, Ehrenfried Zschech<\/span> (2010)<\/span> Microfabricated resistive high-sensitivity nanoprobe for scanning thermal microscopy<\/span>, Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures<\/span> 28<\/span>(6)<\/span>, pp. C6N7-C6N11<\/span>, url<\/span><\/a><\/span>, doi:10.1116\/1.3502614<\/span><\/a><\/span>
<\/p>\n

Pawe\u0142 Janus, Dariusz Szmigiel, M. Weisheit, Grzegorz Wielgoszewski, Yvonne Ritz, Piotr Grabiec, Michael Hecker, Teodor Gotszalk, Przemys\u0142aw Sulecki, Ehrenfried Zschech<\/span> (2010)<\/span> Novel SThM nanoprobe for thermal properties investigation of micro- and nanoelectronic devices<\/span>, Microelectronic Engineering<\/span> 87<\/span>(5-8)<\/span>, pp. 1370-1374<\/span>, url<\/span><\/a><\/span>, doi:10.1016\/j.mee.2009.11.178<\/span><\/a><\/span>
<\/p>\n

2009<\/h2>

Grzegorz Jan Wielgoszewski<\/span> (2009)<\/span> Pomiary cienkich warstw dielektryk\u00f3w podbramkowych za pomoc\u0105 sond z przewodz\u0105cymi ostrzami<\/span>, Innowacyjne rozwi\u0105zania w obszarze automatyki, robotyki i pomiar\u00f3w<\/span>, Janusz Kacprzyk (ed.)<\/span>, pp. 7-17<\/span>, Warszawa: Przemys\u0142owy Instytut Automatyki i Pomiar\u00f3w<\/span>
<\/p>\n

2008<\/h2>

Grzegorz Wielgoszewski, Teodor Gotszalk, Miros\u0142aw Woszczyna, Pawe\u0142 Zawierucha, Ehrenfried Zschech<\/span> (2008)<\/span> Conductive atomic force microscope for investigation of thin-film gate insulators<\/span>, Bulletin of the Polish Academy of Sciences: Technical Sciences<\/span> 56<\/span>(1)<\/span>, pp. 39-44<\/span>, pdf<\/span><\/a><\/span>
<\/p>\n

2007<\/h2>

Grzegorz Wielgoszewski, Miros\u0142aw Woszczyna, Klaudiusz Wo\u017aniak, Pawe\u0142 Zawierucha, Rados\u0142aw Zwierz<\/span> (2007)<\/span> Analogowy regulator PID z cyfrowymi potencjometrami dla system\u00f3w mikroskopii bliskich oddzia\u0142ywa\u0144<\/span>, V Konferencja Naukowa Student\u00f3w<\/span>, Wroc\u0142aw: Politechnika Wroc\u0142awska<\/span>
<\/p>\n

2006<\/h2>

Grzegorz Jan Wielgoszewski, Piotr Mulak, Klaudiusz Wo\u017aniak, Wiktor Herwich, Micha\u0142 Zielony<\/span> (2006)<\/span> Uniwersalny cyfrowy regulator PID do sterowania temperatur\u0105 w uk\u0142adach mikrosystemowych i optoelektronicznych<\/span>, IV Konferencja Naukowa Student\u00f3w<\/span>, Wroc\u0142aw: Politechnika Wroc\u0142awska<\/span>
<\/p>\n\n

(If you cannot see the publication list, please have a look at my ResearchGate<\/a> profiles.)<\/p>","protected":false},"excerpt":{"rendered":"

(The list was prepared by WP Mendeley Plugin by Michael Koch.) (If you cannot see the publication list, please have a look at my ResearchGate profiles.)<\/p>\n","protected":false},"author":1,"featured_media":0,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"ngg_post_thumbnail":0,"footnotes":""},"categories":[3],"tags":[],"class_list":["post-148","post","type-post","status-publish","format-standard","hentry","category-doswiadczenie"],"_links":{"self":[{"href":"https:\/\/grzegorz.wielgoszewski.pl\/en\/wp-json\/wp\/v2\/posts\/148"}],"collection":[{"href":"https:\/\/grzegorz.wielgoszewski.pl\/en\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/grzegorz.wielgoszewski.pl\/en\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/grzegorz.wielgoszewski.pl\/en\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/grzegorz.wielgoszewski.pl\/en\/wp-json\/wp\/v2\/comments?post=148"}],"version-history":[{"count":5,"href":"https:\/\/grzegorz.wielgoszewski.pl\/en\/wp-json\/wp\/v2\/posts\/148\/revisions"}],"predecessor-version":[{"id":652,"href":"https:\/\/grzegorz.wielgoszewski.pl\/en\/wp-json\/wp\/v2\/posts\/148\/revisions\/652"}],"wp:attachment":[{"href":"https:\/\/grzegorz.wielgoszewski.pl\/en\/wp-json\/wp\/v2\/media?parent=148"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/grzegorz.wielgoszewski.pl\/en\/wp-json\/wp\/v2\/categories?post=148"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/grzegorz.wielgoszewski.pl\/en\/wp-json\/wp\/v2\/tags?post=148"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}