(The list was prepared by WP Mendeley Plugin by Michael Koch.)
2023
(2023) Nanomotion technology in combination with machine learning: a new approach for a rapid antibiotic susceptibility test for Mycobacterium tuberculosis, Microbes and Infection 25(7), doi:10.1016/j.micinf.2023.105151
2018
(2018) A low-noise measurement system for scanning thermal microscopy resistive nanoprobes based on a transformer ratio-arm bridge, Measurement Science and Technology 29(4), pp. 045901, url, doi:10.1088/1361-6501/aa9d10
2016
(2016) A symmetrical stretching stage for electrical atomic force microscopy, Measurement 87, pp. 185-188, url, doi:10.1016/j.measurement.2016.03.031
2015
(2015) Carrier density distribution in silicon nanowires investigated by scanning thermal microscopy and Kelvin probe force microscopy, Micron 79, pp. 93-100, url, doi:10.1016/j.micron.2015.08.004
(2015) Scanning Thermal Microscopy (SThM): How to Map Temperature and Thermal Properties at the Nanoscale, Advances in Imaging and Electron Physics, Vol. 190, Peter W. Hawkes (ed.), pp. 177-221, Burlington: Academic Press, url, doi:10.1016/bs.aiep.2015.03.011
(2015) Scanning probe microscopy investigations of the electrical properties of chemical vapor deposited graphene grown on a 6H-SiC substrate, Micron 68, pp. 17-22, url, doi:10.1016/j.micron.2014.08.005
2014
(2014) Investigation of thermal effects in through-silicon vias using scanning thermal microscopy, Micron 66, pp. 63-68, url, doi:10.1016/j.micron.2014.05.008
(2014) Photothermal Measurement by the Use of Scanning Thermal Microscopy, International Journal of Thermophysics, url, doi:10.1007/s10765-014-1613-5
(2014) Fabrication of high aspect ratio microtube arrays for 2D photonic crystals, Materials Research Express 1(2), pp. 026201, url, doi:10.1088/2053-1591/1/2/026201
(2014) Standard-based direct calibration method for scanning thermal microscopy nanoprobes, Sensors and Actuators A: Physical 214, pp. 1-6, url, doi:10.1016/j.sna.2014.03.035
2013
(2013) Skaningowy mikroskop tunelowy do badań nanostruktur grafenowych, Elektronika 54(6), pp. 14-18, url
(2013) Calibration Issues in Scanning Thermal Microscopy Investigations of Thermal Properties of Micro- and Nanostructures, Microtherm 2013, Jacek Podgórski (ed.), pp. 117-121, Łódź: Politechnika Łódzka
(2013) Silicon nanowires reliability and robustness investigation using AFM-based techniques, Proceedings of the SPIE 8902: 11th Electron Technology Conference 2013, Paweł Szczepański, Ryszard Kisiel, Ryszard S. Romaniuk (ed.), pp. 89022L, Ryn: SPIE, url, doi:10.1117/12.2031229
(2013) Thermal mapping of a scanning thermal microscopy tip, Ultramicroscopy 133, pp. 80-87, url, doi:10.1016/j.ultramic.2013.06.020
2011
(2011) Wykorzystanie mikroskopu sił atomowych w trybie stałego prądu do badania materiałów przewodzących i tlenkowych, Elektronika 52(10), pp. 104-106
(2011) Układ samowzbudny na bazie wagi kwarcowej do kalibracji mikroskopu AFM, Wiadomości Elektrotechniczne 79(10), pp. 26-28
(2011) A high-resolution measurement system for novel scanning thermal microscopy resistive nanoprobes, Measurement Science and Technology 22(9), pp. 094023, url, doi:10.1088/0957-0233/22/9/094023
(2011) Scanning thermal microscopy: A nanoprobe technique for studying the thermal properties of nanocomponents, Physica Status Solidi B 248(2), pp. 370-374, url, doi:10.1002/pssb.201046614
2010
(2010) Multibeam setup for observation of the cantilever deflection in the micromechanical sensors matrix, Przeglad Elektrotechniczny 86(10)
(2010) Wielowiązkowy układ do obserwacji ugięcia dźwigni macierzy czujników mikromechanicznych, Przegląd Elektrotechniczny 86(10), pp. 83-85
(2010) Methods of investigation of the properties of the optoelectronic devices with use of atomic force microscopy, 2010 International Students and Young Scientists Workshop "Photonics and Microsystems", pp. 18-20, IEEE, url, doi:10.1109/STYSW.2010.5714160
(2010) Microfabricated resistive high-sensitivity nanoprobe for scanning thermal microscopy, Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 28(6), pp. C6N7-C6N11, url, doi:10.1116/1.3502614
(2010) Novel SThM nanoprobe for thermal properties investigation of micro- and nanoelectronic devices, Microelectronic Engineering 87(5-8), pp. 1370-1374, url, doi:10.1016/j.mee.2009.11.178
2009
(2009) Pomiary cienkich warstw dielektryków podbramkowych za pomocą sond z przewodzącymi ostrzami, Innowacyjne rozwiązania w obszarze automatyki, robotyki i pomiarów, Janusz Kacprzyk (ed.), pp. 7-17, Warszawa: Przemysłowy Instytut Automatyki i Pomiarów
2008
(2008) Conductive atomic force microscope for investigation of thin-film gate insulators, Bulletin of the Polish Academy of Sciences: Technical Sciences 56(1), pp. 39-44, pdf
2007
(2007) Analogowy regulator PID z cyfrowymi potencjometrami dla systemów mikroskopii bliskich oddziaływań, V Konferencja Naukowa Studentów, Wrocław: Politechnika Wrocławska
2006
(2006) Uniwersalny cyfrowy regulator PID do sterowania temperaturą w układach mikrosystemowych i optoelektronicznych, IV Konferencja Naukowa Studentów, Wrocław: Politechnika Wrocławska
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